Speaker
Description
X-ray diffraction computed tomography (XRD-CT) combines the structural sensitivity of diffraction measurements with the spatial resolution of tomography, enabling the non-destructive mapping of crystalline phases and microstructural properties within heterogeneous materials. This talk will provide an overview of XRD-CT methodology and its implementation at the I12-JEEP beamline, with emphasis on the experimental considerations and workflows involved in tomographic acquisition and reconstruction of spatially-resolved diffraction datasets. Approaches for constructing sinograms from sparse datasets collected using continuous-rotation (fly-scanning) acquisitions will be discussed; such sparse sampling approaches allow for the recovery of meaningful spatially-resolved information while substantially reducing acquisition times, thus providing a route towards measurements approaching in-situ timescales. Examples of sparse-data acquisition and reconstruction strategies will be presented, discussing how optimisation of sampling and sinogram construction can expand the capabilities of XRD-CT for dynamic and time-resolved studies at synchrotron beamlines.
