Instituto de Engenharia de Sistemas E Computadores – Microsistemas e Nanotecnologias
Author in the following contributions
- Eddy Current Testing with TMR Probes for Enhanced Quality Control of Arc Stud Welds
- Lithography Optimization with the Use of Artificial Intelligence for Tunneling Magnetoresistive Sensor Fabrication
- Vertical Integration of TMR Sensors for Enhanced Detectivity
- Vertically Packed Architecture for Low Noise AMR Sensors
