Speaker
Description
This study investigates the switching field fluctuations [1] of head-to-head and tail-to-tail domain walls in amorphous microwires under mechanical stress. Using $7$ cm long samples and analyzing experimental data from $2000$ magnetization cycles, our methodology yields separate switching field distributions for the two domain wall configurations. The experimental results reveal that the fluctuations differ significantly between the head-to-head and tail-to-tail domain walls, with one configuration exhibiting markedly larger variability. These differences may be attributed to variations in domain wall width and a potential unidirectional effect [2], where broader domain walls are more susceptible to structural defects, resulting in sequential detachment from multiple pinning sites. These findings deepen our understanding of the interplay between mechanical stress and domain wall dynamics, emphasizing the importance of individually characterizing head-to-head and tail-to-tail configurations in magnetization reversal processes.
Acknowledgements
This work was supported by the TUKE Research Grant for Young Researchers for the year, awarded by the Technical University of Košice, the Slovak Research and Development Agency under contract No. APVV-16-0079 and VEGA Grant No. 1/0180/23 and No. 1/0350/24 from the Scientific Grant Agency of the Ministry for Education of the Slovak Republic.
References
[1] R. Varga et al., “Switching-field distribution in amorphous magnetic bistable microwires,” Physical Review B, vol. 70, no. 2. American Physical Society (APS), Jul. 02, 2004. https://doi.org/10.1103/physrevb.70.024402
[2] J. Onufer et al., “Unidirectional effect in domain wall propagation observed in bistable glass-coated microwire,” Journal of Magnetism and Magnetic Materials, vol. 396. Elsevier BV, pp. 313–317, Dec. 2015. https://doi.org/10.1016/j.jmmm.2015.08.055
